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Key information

Accepted Sample Types

  • All types of solid samples : powder, wafer, fabric, film, single crystal, nanoparticles, bulk, etc.
  • Organic, inorganic, or hybrid materials
  • Metals, graphite, zeolites, fibers, ceramics, thin films

 

  • Location : rue Jean Starcky
  • Monochromatic X-ray source : Al Kα (1486.6 eV), VG Scienta SAX100 with XM780 monochromator
  • Analyzer : Hemispherical, 200 mm radius
  • Operating vacuum : Ultra High Vacuum (UHV), between 10⁻⁹ and 10⁻¹⁰ mbar
  • Detector : MCP with phosphor screen and CCD camera for imaging
  • Energy resolution : 0.4 eV (at Fermi level)
  • Flood Gun : VG Scienta FG300 for analyzing non-conductive samples
  • Detectable elements : All elements from atomic number Z = 3 (except H and He), with concentrations > 0.1 %
  • Analyzed depth : 3 to 9 nm (surface analysis)
  • Sample dimensions : between (6×4 mm) and (30×30 mm), max height : 16 mm
  • Accessibility : Not self-service
  • Data processing : By the manager or the user after training with CasaXPS software

VG SCIENTA SES-2002 XPS Spectrometer

 

What is it for ?

  • Identification and quantification of chemical elements at the surface of materials
  • Study of chemical states and atomic bonding
  • Characterization of thin layers, coatings, and films
  • Analysis of surface contamination and oxidation
  • Investigation of chemical modifications from thermal or ion treatments

Application Areas

  • Catalysis, polymers (functionalization, packaging, plastics, resins, etc.)
  • Metallurgy (corrosion, oxidation, etc.)
  • Aerospace/automotive (adhesion, coatings, paints, etc.)
  • Energy (batteries, biomass, etc.)
  • Microelectronics, biology, nanomaterials, semiconductors, etc.
  • Surface physics and chemistry
  • And more…

Available Measurement Types :

    • General XPS spectrum allows :
      • Identification of all elements (except H and He)
      • Determination of atomic concentrations with a detection limit of 0.1 %

    • High-resolution XPS spectra allow the determination of :
      • The nature of chemical bonds and the local environment of atoms
      • The oxidation states of the elements

    • Angle-resolved XPS (ARXPS) and/or ion sputtering allow :
      • Detection of surface segregation
      • Depth profiling

Possible In-situ Treatments

      • Argon ion sputtering (Ar⁺) : Our ion gun enables sputtering for depth profiling or surface cleaning
      • Thermal treatment : A heating device allows reaching up to 850°C under UHV or controlled atmosphere
      • Residual gas analysis using a mass spectrometer
      • Gas adsorption : Equipped with a gas line for adsorption experiments up to atmospheric pressure.
    •   Other Equipment
      • Transport suitcase for samples sensitive to air : Enables transferring samples prepared in a glove box under argon atmosphere and analyzing them by XPS without any exposure to ambient air.