Key Sample Information:
- Location: Rue A. Werner
- Sample Preparation
- Maximum Sample Size:
- ⌀ < 5 cm; Height < 4 cm
- Transmission Mode:
- Thickness < 100 nm
- Diameter < 3 mm
- Maximum Sample Size:
- Electron Source: Schottky field emission gun
- Operating Modes:
- High vacuum: standard observation with ultra-high resolution
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Low vacuum: up to 300 Pa (N₂), for insulating samples
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Transmission: BF, DF, HAADF imaging
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Resolution:
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High vacuum: 0.5 nm
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Low vacuum: 1.4 to 4 nm (depending on pressure)
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Transmission: 0.5 nm
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Accessibility: Not available for self-service
Scanning Electron Microscope – JEOL JSM-7900F
A high-end field emission SEM for high-resolution surface imaging and analysis, including transmission mode.
What is it for ?
This microscope is designed for high-precision surface imaging, analysis of insulatingmaterials without metallization, and fine observations in transmission mode. It also enables accurate elemental chemical analysis via EDX.
Fields of application:
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Nanomaterials, polymers, ceramics
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Insulating and conductive materials
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Thin films and functionalized surfaces
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Microelectronics, catalysis
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Materials science, physics, analytical chemistry
Available Measurement Types
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High-resolution SEM imaging: up to 0.5 nm in high vacuum mode
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Observation of insulating samples in low vacuum without metallization
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Transmission imaging (BF, DF, HAADF) for thin objects
- EDX analysis:
- Detection from boron
- Quantification from fluorine
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Elemental mapping
- Sample decontamination using integrated plasma cleaner