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X-Ray Diffraction (XRD)

X-ray diffraction gives information on the ordered solid at ambient temperature and during heat treatment. The geometric arrangement of the atoms and the distance between them constitute a unique identity card for each compound. X-ray diffusion at small angles studies the organisation of matter over a few nanometers.

Managers

Laure Michelin and Ludovic Josien
Contacts: laure.michelin@uha.fr or ludovic.josien@uha.fr

Scientific Manager

Jean-Marc Le Meins

Contact: Jean-marc.le-meins@uha.fr

Description

Areas of activity:

The activities of the platform focus on the structural characterisation of all types of solid materials by X-ray diffraction or diffusion: identification of phases, study of crystallinity or organisation, reflectometry, grazing incidence, structural determination on powder, observation of phase transitions in temperature and controlled atmosphere. In addition, these characterisations can be supplemented by X-ray Fluorescence spectrometry analyses which make it possible to determine the chemical composition of a sample and thus facilitate structural identification.

Main equipment (strengths of the Institute):

The platform has 3 diffractometers, one thermodiffractometer, and an X-ray fluorescence spectrometer:

3 powder diffractometers: 2 in reflection geometry with autosampler (Bruker D8 ADVANCE and PANalytical, X’Pert PRO MPD) and 1 in transmission geometry (STOE Stadi-P and Bruker D8 ADVANCE)
1 thermodiffractometer (PANalytical, X’Pert PRO MPD) equipped with a temperature chamber (Anton Paar HTK1200)
1 Wavelength Dispersion X-Ray Fluorescence Spectrometer (PANalytical, Zetium)