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Key Sample Information:

  • Location: Rue J. Starcky

  • Electron Source: Cold Field Emission Gun (FEG) by Canon

  • Operating Mode: High vacuum

  • Acceleration Voltages: 80 kV or 200 kV

  • Configuration: TEM and STEM

  • Spatial Resolution: 80 pm (lattice fringe mode)

  • Objective Lens Corrector: Yes

    Sample Preparation

  • Samples must have a thickness of less than 100 nm, obtained through grinding, ultramicrotomy, or another suitable mineralization method.

          Accessibility: Not available for self-service

 

Transmission Electron Microscope – JEOL ARM200

A high-resolution TEM/STEM microscope dedicated to structural, chemical, and crystallographic analysis at the atomic scale.

What is it for ?

This microscope is intended for atomic-scale materials characterization:

  • imaging of crystal lattices,
  • chemical mapping,
  • fine structure or defect analysis,
  • electron tomography

Fields of application:

  • Nanomaterials and crystalline materials
  • Semiconductors and thin films
  • Ultra-thin biomaterials
  • Catalysis, ceramics, functional polymers
  • Materials science, chemistry, solid-state physics

 

Available Measurement Types

  • High-resolution TEM imaging: up to 80 picometers
  • STEM mode: for Z-contrast or high chemical sensitivity
  • EDX analysis:
  • Semi-quantitative
  • Detection starting from boron
  • Elemental mapping
  • Electron diffraction:
  • Determination of interplanar spacings
  • Crystalline phase analysis
  • Electron tomography:
  • 3D reconstruction of nanoparticles or complex objects