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Key Sample Information:

  • Sample Constraints
    • Maximum size: 1.5 × 1.2 cm
    • Maximum thickness: < 6 mm
  • Piezoelectric scanners:
    • Scanner 10678JVHC: 178 × 178 × 5 µm (X/Y/Z)
    • Scanner 10405EVLR: 14 × 14 × 3 µm (X/Y/Z)
    • Detector: 4-quadrant photodiode
  • Resolution: Atomic resolution; vertical resolution in the sub-nanometer range
  • Accessibility: Self-service for staff and PhD students after training by the technical manager
  • Location: Rue J. Starcky

Available Accessories

  • STM head (Scanning Tunneling Microscopy)
  • Temperature controller
  • Magnetic controller
  • Liquid measurement cell
  • Temperature measurement cell 

Atomic Force Microscope – NanoScope IV

The NanoScope IV is a high-performance atomic force microscope designed for topographic and functional surface analysis at the nanometer scale. It is particularly well-suited for the characterization of local mechanical, electrical, and magnetic properties.

What is it for ?

The NanoScope IV enables:

  • High-resolution surface morphology imaging
  • Mapping of local mechanical properties (modulus, adhesion, etc.)
  • Analysis of electrostatic and magnetic contrast
  • Measurement of intermolecular forces

Fields of application:

  • Nanostructured materials (metals, polymers, composites)

  • Thin films, coatings, and layers

  • Nanotechnology and microfabrication

  • Characterization in liquid or controlled environments

  • Applications in physics, chemistry, and biology

 

Available Measurement Types

Operating Modes

  • Contact mode:
    • Topography
    • Friction
    • Adhesion
    • Force modulation
  • Resonant modes:
    • Tapping mode
    • Phase contrast
    • KPFM (Kelvin Probe Force Microscopy)
    • EFM (Electrostatic Force Microscopy)
    • MFM (Magnetic Force Microscopy)
  • PeakForce QNM mode:
    • Quantitative mapping of nanomechanical properties (Young’s modulus, adhesion, deformation)

Operating Environments

  • Air
  • Liquid
  • Controlled atmosphere