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Key Sample Information

Accepted samples:

  • Powders (approx. 400 mg)
  • Fibers
  • Bulk samples (depending on compatibility)

Technical Specifications

 

  • Location: rue J. Starcky
  • X-ray source: Copper anode (λ = 1.54 Å)
  • Goniometer: Vertical θ–θ scan geometry
  • Typical angular range: 2° to 130° 2θ (in reflection, depending on accessory)
  • Minimum angular step: 0.0001° 2θ
  • Detector: LynxEye XE-T with energy discrimination (<380 eV in high-resolution mode)
  • Monochromator: Not equipped (Cu, K⍺1, K⍺2)
  • Autosampler: Up to 15 samples
  • Specific accessory: Motorized XYZ stage (for grazing incidence and reflectometry)

X-ray Diffractometer – Bruker D8 ADVANCE A25

The Bruker D8 ADVANCE A25 is a high-precision X-ray diffractometer designed for structural analysis of materials in the form of powders, thin films, fibers, or bulk samples. It supports a wide range of measurements thanks to its modular geometry and dedicated accessories.

What is it for?

  • Identification of crystalline phases

  • Characterization of sample microstructure (coherent domain size, stress, microstrain)

  • Structural characterization (lattice parameters, crystal structure

Available Measurement Types

 

  • Reflection diffraction (Bragg-Brentano)

  • Transmission diffraction

  • Grazing incidence diffraction (with motorized XYZ stage)