Key Sample Information
Accepted sample types:
- Powders
- Bulk samples (diameter < 43 mm, height < 6 mm)
Technical Specifications
- Commissioning year: 2023
- Location: Rue A. Werner
- X-ray source: Copper anode (λ = 1.5406 Å)
- Geometry: Capillary or film transmission, Bragg-Brentano reflection
- Angular scan range: 0.5° to 140° 2θ
- Minimum angular step size: 0.002° 2θ
- Detector: PIXcel 1D
- Monochromator: Johansson 1xGe111 Cu/Co
- Incident beam optics:
- Focusing mirror
- Soller slits: 0.02 rad
- Primary masks: 10 mm and 20 mm
- Fixed divergence slits: 1/32° to 1°
- Fixed anti-scatter slits: 1/32° to 1°
- Nickel filter
- Attenuator
- Divergent beam optics:
- Anti-scatter slits: 1/32° to 4°
- Nickel filter
- Soller slits: 0.02 rad
Access
Self-service: Partial
- Yes, for standard analyses after training by the technical manager
- No, for configuration changes (requires intervention by the technical manager)
PANalytical Empyrean X-ray Diffractometer with Monochromatic Kα1 Beam
The PANalytical Empyrean is a high-performance X-ray diffractometer designed for the structural analysis of crystalline materials in various geometric configurations. Equipped with a monochromaticCu Kα1 beam, it is particularly suited for transmission and reflection diffraction on powder or bulk samples.
What is it for?
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Identification of crystalline phases
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Crystallite size analysis
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Texture and residual stress characterization
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Thin film analysis
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Grazing incidence studies
Available Measurement Types
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Reflection diffraction (Bragg-Brentano geometry)
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Transmission diffraction (capillary or film, Debye-Scherrer geometry)
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Grazing incidence X-ray diffraction (GIXRD)
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Residual stress and texture analysis
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Thin film characterization