Back

Key Sample Information :

  • Location : Rue J. Starcky
  • Piezoelectric scanner : Pb(Zr,Ti)O₃ (PZT)
  • Scan range : X/Y : 100 µm × 100 µm, Z : 10 µm
  • Detector : 4-quadrant photodiode
  • Resolution : Atomic resolution ; vertical resolution in the sub-nanometer range
  • Accessibility : Self-service for staff and PhD students with a large number of samples, after training by the technical manager

Available Accessories

  • Liquid cell
  • Sample holder with tensile device
  • Heating stage

Atomic Force Microscope – FlexAFM

The FlexAFM is a high-precision atomic force microscope designed for the study of surface topography and local mechanical and electromagnetic properties at the nanometer scale. It offers great flexibility and can be operated in variousenvironments (air, liquid, glove box).

What is it for ?

The FlexAFM enables :

 

  • Nanometric surface topography imaging
  • Measurement of interaction forces (adhesion, friction)
  • Local analysis of electrostatic, magnetic, and mechanical properties
  • Contact-mode nanolithography

Fields of application :

 

  • Materials : metals, polymers, ceramics
  • Biology : molecules, membranes, cells
  • Nanotechnology : nano-objects, thin films, fibers, powders
  • Surface chemistry
  • Characterization in specific conditions : liquid, controlled atmosphere, glove box

Available Measurement Types

Operating Modes

  • Contact mode :
    • Surface morphology
    • Adhesion force
    • Nanolithography
    • Force modulation
    • Friction force
  • Resonant modes :
    • Tapping mode
    • Phase contrast
    • KPFM (Kelvin Probe Force Microscopy)
    • EFM (Electrostatic Force Microscopy)
    • MFM (Magnetic Force Microscopy)