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Key Sample Information :

  • Sample Constraints
    • Maximum size : 1.5 × 1.2 cm
    • Maximum thickness : < 6 mm
  • Piezoelectric scanners :
    • Scanner 10678JVHC : 178 × 178 × 5 µm (X/Y/Z)
    • Scanner 10405EVLR : 14 × 14 × 3 µm (X/Y/Z)
    • Detector : 4-quadrant photodiode
  • Resolution : Atomic resolution ; vertical resolution in the sub-nanometer range
  • Accessibility : Self-service for staff and PhD students after training by the technical manager
  • Location : Rue J. Starcky

Available Accessories

  • STM head (Scanning Tunneling Microscopy)
  • Temperature controller
  • Magnetic controller
  • Liquid measurement cell
  • Temperature measurement cell 

Atomic Force Microscope – NanoScope IV

The NanoScope IV is a high-performance atomic force microscope designed for topographic and functional surface analysis at the nanometer scale. It is particularly well-suited for the characterization of local mechanical, electrical, and magnetic properties.

What is it for ?

The NanoScope IV enables :

  • High-resolution surface morphology imaging
  • Mapping of local mechanical properties (modulus, adhesion, etc.)
  • Analysis of electrostatic and magnetic contrast
  • Measurement of intermolecular forces

Fields of application :

  • Nanostructured materials (metals, polymers, composites)

  • Thin films, coatings, and layers

  • Nanotechnology and microfabrication

  • Characterization in liquid or controlled environments

  • Applications in physics, chemistry, and biology

 

Available Measurement Types

Operating Modes

  • Contact mode :
    • Topography
    • Friction
    • Adhesion
    • Force modulation
  • Resonant modes :
    • Tapping mode
    • Phase contrast
    • KPFM (Kelvin Probe Force Microscopy)
    • EFM (Electrostatic Force Microscopy)
    • MFM (Magnetic Force Microscopy)
  • PeakForce QNM mode :
    • Quantitative mapping of nanomechanical properties (Young’s modulus, adhesion, deformation)

Operating Environments

  • Air
  • Liquid
  • Controlled atmosphere