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Key Sample Information :

  • Sample Preparation
    • Supported materials : Metals, polymers, adsorbed molecules…
    • Formats : Bulk samples, thin films, fibers, powders

  • Constraints :
    • Maximum size : 1.5 × 1.2 cm
    • Thickness : < 6 mm

 

  • Piezoelectric scanner : 5161EVLR
  • Scan range : 140 × 140 × 3 µm (X/Y/Z) 
  • Detector : 4-quadrant photodiode
  • Resolution : Atomic resolution ; Z-resolution in the sub-nanometer range
  • Accessibility : Self-service for staff and PhD students after training by the technical manager
  • Location : 3bis rue Alfred Werner

Atomic Force Microscope – NanoScope V

The NanoScope V allows ultra-high-resolution surface analysis in ambient conditions, liquid environments, or controlled atmospheres. It is suitable for a wide range of materials and offers multiple imaging modes, from simple topography to the characterization of electrostatic or magnetic forces.

What is it for ?

This microscope is used for :

  • Nanometer-scale topographic imaging
  • Surface mechanical interaction analysis (adhesion, friction)
  • Investigation of local electrical and magnetic properties

Fields of application :

  • Materials science
  • Surface chemistry
  • Biology and biointerfaces
  • Nanotechnology
  • Characterization of polymers, thin films, fibers, powders, etc.

Available Measurement Types

Operating Modes

  • Contact mode :
    • Topography
    • Friction
    • Adhesion
    • Force modulation
       
  • Resonant modes :
    • Tapping mode
    • Phase contrast
    • KPFM (Kelvin Probe Force Microscopy)
    • EFM (Electrostatic Force Microscopy)
    • MFM (Magnetic Force Microscopy)
       
  • PeakForce QNM mode :
    • Quantitative mapping of nanomechanical properties (Young’s modulus, adhesion, deformation)

Operating Environments

  • Air
  • Liquid
  • Controlled atmosphere