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Key Sample Information :

  •  Location : Rue A. Werner
  • Sample Preparation
    • Maximum Sample Size :
      • ⌀ < 5 cm ; Height < 4 cm
    • Transmission Mode :
      • Thickness < 100 nm
      • Diameter < 3 mm
  • Electron Source : Schottky field emission gun
  • Operating Modes :
    • High vacuum : standard observation with ultra-high resolution
    • Low vacuum : up to 300 Pa (N₂), for insulating samples
    • Transmission : BF, DF, HAADF imaging
  • Resolution :
    • High vacuum : 0.5 nm
    • Low vacuum : 1.4 to 4 nm (depending on pressure)
    • Transmission : 0.5 nm
  • Accessibility : Not available for self-service

Scanning Electron Microscope – JEOL JSM-7900F

A high-end field emission SEM for high-resolution surface imaging and analysis, including transmission mode.

What is it for ?

This microscope is designed for high-precision surface imaging, analysis of insulatingmaterials without metallization, and fine observations in transmission mode. It also enables accurate elemental chemical analysis via EDX.

Fields of application :

  • Nanomaterials, polymers, ceramics
  • Insulating and conductive materials
  • Thin films and functionalized surfaces
  • Microelectronics, catalysis
  • Materials science, physics, analytical chemistry

 

Available Measurement Types

  • High-resolution SEM imaging : up to 0.5 nm in high vacuum mode
  • Observation of insulating samples in low vacuum without metallization
  • Transmission imaging (BF, DF, HAADF) for thin objects
  • EDX analysis :
    • Detection from boron
    • Quantification from fluorine
    • Elemental mapping
  • Sample decontamination using integrated plasma cleaner