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Key Sample Information

Accepted samples :

  • Powders (approx. 400 mg)
  • Fibers
  • Bulk samples (depending on compatibility)

Technical Specifications

 

  • Location : rue J. Starcky
  • X-ray source : Copper anode (λ = 1.54 Å)
  • Goniometer : Vertical θ–θ scan geometry
  • Typical angular range : 2° to 130° 2θ (in reflection, depending on accessory)
  • Minimum angular step : 0.0001° 2θ
  • Detector : LynxEye XE-T with energy discrimination (<380 eV in high-resolution mode)
  • Monochromator : Not equipped (Cu, K⍺1, K⍺2)
  • Autosampler : Up to 15 samples
  • Specific accessory : Motorized XYZ stage (for grazing incidence and reflectometry)

X-ray Diffractometer – Bruker D8 ADVANCE A25

The Bruker D8 ADVANCE A25 is a high-precision X-ray diffractometer designed for structural analysis of materials in the form of powders, thin films, fibers, or bulk samples. It supports a wide range of measurements thanks to its modular geometry and dedicated accessories.

What is it for ?

  • Identification of crystalline phases

  • Characterization of sample microstructure (coherent domain size, stress, microstrain)

  • Structural characterization (lattice parameters, crystal structure

Available Measurement Types

 

  • Reflection diffraction (Bragg-Brentano)

  • Transmission diffraction

  • Grazing incidence diffraction (with motorized XYZ stage)