Key Sample Information
- Sample types : Powders or bulk solids
- Constraints :
- Diameter < 43 mm
- Height < 6 mm
- Sample changer capacity : Up to 45 samples (reflection and transmission modes)
Technical Specifications
- X-ray source : Copper anode (λ = 1.5418 Å)
- Goniometer : Vertical θ–θ configuration
- Detector : 1Der (1D solid-state detector)
- Incident Beam Optics – ICore
- Soller slits : BBHD 0.03 rad
- Bragg-Brentano HD mirror : Cu
- Primary beam masks : 0.2, 0.3, 2, 14 mm
- Divergence slits : Automatic or fixed (from 1/50° to 1/2°)
- Attenuators :
- Cu (0.1 mm)
- Cu (0.2 mm) / Ni (0.2 mm)
- Divergent Beam Optics – DCore
- Soller slits : 0.02 rad and 0.04 rad
- Anti-scatter slits : From 1/32° to 4°
- Parallel beam collimators : 0.11° and 0.28°
- Filter : Ni
- Attenuator : Cu (0.1 mm)
Access
- Not in self-service
- Users are responsible for sample preparation
- Sample changer is programmed and verified by the technical manager
PANalytical Empyrean – X-ray Diffractometer with Automated Sample Changer
The PANalytical Empyrean is a state-of-the-art X-ray diffractometer designed for high-precisionanalysis of crystalline structures in reflection or transmission modes. Its versatile configuration and automated sample changer make it ideal for the analysis of powders, thin films, and bulk materials.
What is it for ?
- The Empyrean diffractometer enables :
- Identification of crystalline phases
- Crystallinity assessment
- Detailed structural analysis
- Characterization of thin films and multilayers
Application Fields
- Inorganic materials : ceramics, metals, alloys
- Organic materials : crystalline polymers, pharmaceutical active ingredients
- Geosciences : minerals, soils, rocks
- Functional materials : conductive oxides, battery materials
- Thin films : CVD/PVD coatings, organic layers
- Monitoring of thermal or chemical transformations (e.g., annealing, aging)
Available Measurement Types
-
Reflection geometry (Bragg-Brentano)
-
Transmission geometry (Debye-Scherrer for thin films)
-
Angular range : 0.5° – 140° (2θ)
- Angular resolution : step size of 0.002° (2θ