Manager

Samar Garreau
Contacts : philippe.fioux@uha.fr or samar.garreau@uha.fr

Description

The XPS platform is dedicated to the elemental and functional chemical analysis of the outermost surface layers of materials.
X-ray Photoelectron Spectroscopy (XPS) allows investigation of the top 3 to 9 nanometers of the surface.

The main equipment is the SES-2002 spectrometer (VG SCIENTA), equipped with a monochromatic X-ray source and an electron flood gun for analyzing insulating materials. A preparation chamber attached to the spectrometer enables various in-situ treatments.

Available Measurement Types

 

• General XPS spectrum allows :
  • Identification of all elements (except H and He)
  • Determination of atomic concentrations with a detection limit of 0.1 %

• High-resolution XPS spectra allow the determination of :
  • The nature of chemical bonds and the local environment of atoms
  • The oxidation states of the elements

• Angle-resolved XPS (ARXPS) and/or ion sputtering allow :
  • Detection of surface segregation
  • Depth profiling