AFM or Near Field Microscopy
The AFM platform characterises materials and nanostructures at the nanoscale and atomic scale by imaging.
Leader
Airoudj Aissam
Contacts : aissam.airoudj@uha.fr ou philippe.kunemann@uha.fr
Description
Areas of activity :
The AFM (Near Field Microscopy) platform is dedicated to the imaging and characterisation of materials and nanostructures at the nanoscale. Near-field microscopy responds to the growing need for IS2M’s various research areas to add a 3-dimensional observation tool. In this way, it complements other conventional microscopy techniques to monitor their technology on an ever smaller scale.
In addition, it provides the opportunity to characterise at physical (electrical, mechanical, magnetic …) and chemical behaviour of new materials or components at the nanoscale.
Main equipment (strengths of the Institute) :
IS2M’s near-field microscopy platform is equipped with :
- 3 atomic force microscopes (AFM) :
- NanoScope IV
- NanoScope V
- FlexAFM
- 1 Tunnel Effect Microscope
The four AFM sets are complementary : they cover a wide range of sample sizes and access various environmental conditions (neutral gas, controlled humidity, liquid medium, variable temperature from -40°C to 350°C). Two of the systems also make it possible to work in STM.
Technical description
Atomic Force Microscope FlexAFM
| Location | rue J. Starcky |
| Piezoelectric scanner | Pb (Ti, Zr) O3 (PZT). |
| X/Y/Z scanning range | 100μm x 100μm x 10μm. |
| Detector | 4 quadrant photodiodes. |
| Resolution | atomic resolution and z resolution of the order of the nm fraction |
| Operating mode | contact mode : surface morphology, friction force, adhesion force, force modulation, nano-lithography,… resonant modes : tapping mode, phase contrast, KPFM, EFM, MFM… |
| Sample preparation | studies can be carried out on all types of samples (metals, polymer, absorbed molecules … samples in the form of parts, films, fibres, powders… |
| Workplace | air, controlled atmosphere, liquid medium, work in glove box |
| Accessories | liquid cell, sample holder/under stretch, hot plate |
| Self-service accessibility | yes for permanent and PhD students with a large number of samples and after training by the technical manager |
Contact people : Aissam Airoudj, Philippe Kunemann
NanoScope IV Atomic Force Microscope
| Location | rue J. Starcky |
| Piezoelectric scanner | 2 types of scanner
10678JVHC Scanner/X/Y/Z Scanning Range : 178μm x 178μm x 5μm |
| Detector | 4 quadrant photodiodes. |
| Resolution | atomic resolution and z resolution of the order of the nm fraction |
| Operating mode | contact mode : surface morphology, friction force, adhesion force, force modulation resonant modes : tapping mode, phase contrast, KPFM, EFM, MFM… Peak-Force Mode QNM (Quantitative Nanomechanical Property Mapping) |
| Sample preparation | studies can be carried out on all types of samples (metals, polymer, absorbed molecules … samples in the form of parts, films, fibres, powders… |
| Sample preparation constraint | maximum size 1.5cm x 1.2cm, thickness < 6 mm. |
| Workplace | air, liquid medium, controlled atmosphere |
| Accessories | STM head, temperature controller, magnetic controller, liquid cell, temperature cell |
| Self-service accessibility | yes for permanent and PhD students with a large number of samples and after training by the technical manager |
Contact people : Aissam Airoudj, Philippe Kunemann
NanoScope V Atomic Force Microscope
| Location | 3 bis, rue Alfred Werner |
| Piezoelectric scanner | 5161EVLR |
| X/Y/Z scanning range | 140μm x 140μm x 3μm. |
| Detector | 4 quadrant photodiodes. |
| Resolution | atomic resolution and z resolution of the order of the nm fraction |
| Operating mode | contact mode : surface morphology, friction force, adhesion force, force modulation resonant modes : tapping mode, phase contrast, magnetic and electrostatic forces |
| Sample preparation | studies can be carried out on all types of samples (metals, polymer, absorbed molecules … samples in the form of parts, films, fibres, powders… |
| Sample preparation constraint | maximum size 1.5cm x 1.2cm, thickness < 6 mm. |
| Workplace | air, liquid medium, controlled atmosphere |
| Accessories | STM head, liquid STM, magnetic controller, liquid cell. |
| Self-service accessibility | yes for permanent and PhD students with a large number of samples and after training by the technical manager |
Contact person : aissam airoudj
IS2M
Bâtiment CNRS
15, rue Jean Starcky - BP 2488
68057 Mulhouse cedex
Bâtiment IRJBD
3 bis, rue Alfred Werner
68093 Mulhouse cedex
tel: (+33)3 89 60 87 00
fax: (+33)3 89 60 87 99
